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One microscope with all the routine imaging modes BF, DF, DIC, POL, OBLIQUE, NIR & FL Plus a Smart-Scope with the next 3 steps in microscopy

Nanometer scale 3D surface imaging and measurements
Artificial Intelligence to perform defect analytics
Multi-microscope unification and data mining to build a useful library of information.

One microscope with all the routine imaging modes BF, DF, DIC, POL, OBLIQUE, NIR & FL Plus a Smart-Scope with the next 3 steps in microscopy

Nanometer scale 3D surface imaging and measurements
Artificial Intelligence to perform defect analytics
Multi-microscope unification and data mining to build a useful library of information.

SEM AFM BTBP

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Solder Bumps

Step Height

Nano Meter level details

Mesh Overlay on 3D Models

Line Profile

AFM standard with defect below the 50nm step, measured at 9nm

The Future of Life Science Cell Surface Imaging

3D global curvature and local height variation

Solder Bumps

LCD display from an Apple iPad, liquid crystals, transistors and touch screen sensors

RGB Color Filter from an Apple LCD Display

Apple iPad LCD display at 100x objective magnification

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